Control on spatial location and density of defects in two-dimensional materials can be achieved using electron beam irradiation. Conversely, ultralow […]

Optical contrast is the most common preliminary method to identify layer number of two-dimensional (2D) materials, but it is seldom […]

Fabricating van der Waals (vdW) bilayer heterostructures (BL-HS) by stacking the same or different two-dimensional (2D) layers, offers a unique […]

Transition metal dichalcogenides (TMDs) have been explored extensively for visible spectrum optoelectronics; the NIR properties of these layered materials have […]

Resolution limits of conventional optical methods do not allow for direct nanoscale optical-structural correlation measurements of ultrathin TMD materials, particularly […]

Zirconium disulfide (ZrS2) and zirconium diselenide (ZrSe2) are promising materials for future optoelectronics due to indirect band gaps in the […]